Products
Open Short Tester/Handler
Panther III/IIIX OS Tester
Panther IIIX is an ultra fast Open Short and leakage Tester that is designed for high UPH test in assembly.
Today ICs come with higher and higher pin/ball count requiring a high number of wire bonding. The higher the pin/ball count, the higher is the likelihood of Open Short failures.
The cost of the die for high pin count devices is also high and device manufacturers want IC assemblers to ship them with a high percentage of good parts free of any assembly defects.
The Panther OS Tester provides the solution to meet these requirements. It can be integrated to an automated handler system to test BGA strips, leaded package strips and singulated units of up to 2048 pins or balls. With an average test speed is 1ms per pin/ball a 400 ball BGA device will require a test time of about 400msecond.
The Panther is versatile and can be configured to test between any pins or balls or ground or VCC pins. It uses a Precision Measurement Unit (PMU) for accurate measurements and can perform parallel testing e.g. one PMU for all mux cards or one PMU per mux card in the case of high speed parallel tests requirement. It can be configured in Force Current or Voltage mode with clamps. This enabled the Panther to be extremely versatile.
Qtest’s Panther testers have been used by a numbers of IC assembly houses including a Japanese IC original device manufacturer who for the first time qualified and used 2 units of Panther OS leakage testers, a non Japanese made machine for their production line. These testers were integrated to their Trim Form machines.
